Presenter: Thomas Nägele
Date: July 9, 16h00
Venue: Université de Lorraine
From Knowledge Graphs to Probabilistic Models for System-Level Diagnostics
I will present a methodology that uses knowledge graphs as a central knowledge base for diagnostics of high-tech systems. Our ontology ensures consistency of the stored information and enables automatic transformation of the contained knowledge to a probabilistic graphical model.
This model can be used to assist field service engineers in the field in diagnosing a troubled system by presenting suspected components and suggesting next steps in the diagnosis.
(naar homepage)